X-ray fluorescence (XRF) is an analytical technique, which is covering the elemental range from Beryllium to Uranium in solids and from Sodium to Uranium in liquids in the concentration range from sub-ppm to 100% quantitatively with a high accuracy.
The XRF is known as a fast and stable method which benefits from a rather easy sample preparation. The prepared samples are not being affected during the measurement. In this sense, the XRF is a non-destructive method.
In addition to the quantitative analysis, precalibrated (standardless) programs enable a fast semiquantitative overview in totally unknown samples over all measurable elements with surprisingly good results.
The technique of XRF has been well approved in quality-control as well as in geological research and in the field of environmental protection.
In addition to the analysis of chemical elements, the technique of XRF enables as well the determination of layer thicknesses of coated surfaces.
The full analytical power of the XRF-technique is open to well trained people.
It is our goal to enable XRF-users to make full use of the analytical power of the instrument by training and consulting in the complete field of sample preparation up to the correct analytical results and instrumental stability control.